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Proceedings Paper

Optical design and certification of correctors
Author(s): Yongqian Wu; Yudong Zhang; Fan Wu; Gaofeng Wu
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Paper Abstract

This report gives the optical design and analysis of a null corrector. The aberration of the null correctors is PV0.0051λ.A new system for measuring the null corrector is presented in this paper. The principle of certification and detailed error analysis are introduced.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84173Q (15 October 2012); doi: 10.1117/12.978224
Show Author Affiliations
Yongqian Wu, Institute of Optics and Electronics (China)
Yudong Zhang, Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Gaofeng Wu, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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