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Proceedings Paper

New Applications For Infrared Microimaging
Author(s): Herbert Kaplan
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Paper Abstract

Within the past year, several papers have been presented concerning the advent of a new device for real-time non-contact thermal imaging of microscopic targets. This device, the BM-50 IR Microscanner has since been utilized in several new and interesting areas of non-destructive testing and it is the purpose of this paper to discuss these new applications and to project sore areas which show future promise.

Paper Details

Date Published: 1 August 1972
PDF: 10 pages
Proc. SPIE 0029, Imaging Techniques for Testing and Inspection, (1 August 1972); doi: 10.1117/12.978155
Show Author Affiliations
Herbert Kaplan, Barnes Engineering Co. (United States)

Published in SPIE Proceedings Vol. 0029:
Imaging Techniques for Testing and Inspection
John C. Urbach; Byron B. Brenden; Robert Apprahamian, Editor(s)

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