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Proceedings Paper

Measurement of the roughness surface using the normalized autocorrelation function of the fields of the texture of speckle pattern
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Paper Abstract

We present a new method of measure of the roughness based on the analysis of the texture of speckle pattern on the surface. Images of speckle pattern over the surface are captured by means of a simple configuration using a laser, beam expander, and a camera charge coupled device (CCD). Using the properties of the normalized covariance function that we obtain from the image of the speckle through the inverse Fourier transform, we relate the values of the normalized covariance function. We compare the results obtained with the results obtained with a confocal microscope. This method can be considered as a noncontact surface profiling method and is easy to implement and can be used during the manufacturing process.

Paper Details

Date Published: 11 September 2012
PDF: 6 pages
Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84131P (11 September 2012); doi: 10.1117/12.978077
Show Author Affiliations
Abdiel O. Pino, Univ. Tecnológica de Panamá (Panama)
Josep Pladellorens, Univ. Politècnica de Catalunya (Spain)


Published in SPIE Proceedings Vol. 8413:
Speckle 2012: V International Conference on Speckle Metrology
Ángel Fernandez Doval; Cristina Trillo, Editor(s)

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