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Proceedings Paper

A fast and robust approach to phase shift registration from randomly phase shifted interferograms
Author(s): Alexander Hildebrand; Claas Falldorf; Christoph von Kopylow; Ralf B. Bergmann
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Paper Abstract

We present a fast and robust approach to phase shift registration from randomly phase shifted interferograms. The approach is based on a singular value decomposition followed by an iterative, projection based optimization procedure. Compared to known algorithms it is fast and shows comparable or better registration quality depending on the case of application.

Paper Details

Date Published: 11 September 2012
PDF: 6 pages
Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84130R (11 September 2012); doi: 10.1117/12.978027
Show Author Affiliations
Alexander Hildebrand, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
Claas Falldorf, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
Christoph von Kopylow, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)


Published in SPIE Proceedings Vol. 8413:
Speckle 2012: V International Conference on Speckle Metrology
Ángel Fernandez Doval; Cristina Trillo, Editor(s)

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