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Proceedings Paper

Novel determination method of laser damage threshold
Author(s): Lihong Yang; Wei Shi; Junhong Su
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Paper Abstract

The determination method of laser damage of thin film and the evaluation method of damage threshold are indispensable for enhancing anti-laser ability of infrared system observation window and its operating performance. A novel method for determining laser damage threshold of thin film is proposed. Firstly, by using the two images that has taken from CCD before and after laser illumination, the method realizes the image matching the damaged image and the undamaged image which is regarded as template image through the control point examination and the affine transformation. Secondly, the damage threshold of thin film is examined through analyzing the average gray level and standard deviation of various regions of the image. Finally, a algorithm based on template image match is established. The research on examining the damage threshold for substrate Si shows that the method, which combine with image match calibration technology, is simple and feasible, and can be used to determinate the damage threshold of thin film.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84171Q (15 October 2012); doi: 10.1117/12.977939
Show Author Affiliations
Lihong Yang, Xi'an Technological Univ. (China)
Wei Shi, Xi'an Technological Univ. (China)
Junhong Su, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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