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Proceedings Paper

Color reconstruction of medium infrared polarization images based on HSV and wavelet packet transform
Author(s): Weili Chen; Shuhua Wang; Weiqi Jin; Xia Wang
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Paper Abstract

Infrared polarization imaging technology is a new detection technique, and it can distinguish busy background and target through the infrared polarization characteristics of target. Compared with the traditional infrared imaging technology, infrared polarization imaging technology has obvious preponderance at the aspect of target identify. Based on the characteristics that the infrared polarization image can highlight the target contour and enhance the detail of the scene, an infrared polarization fusion method based on wavelet packet transform is proposed. And a new color reconstruction method based on wavelet packet is presented through analyzed corresponding relation between HSV color space and radiation and polarization images. The innovative point is that use the fusion image instead of radiation image be transmitted channels V of HSV space, and the fusion images are gain by wavelet packet transform. Meanwhile, it is objective evaluated that the color reconstruction image by objective evaluation function based on details. The evaluation function is contrast index of frequency band. The result show that the new method that is presented can enhance detail information, and it is helpful to study color fusion.

Paper Details

Date Published: 15 October 2012
PDF: 9 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84201E (15 October 2012); doi: 10.1117/12.977930
Show Author Affiliations
Weili Chen, Science and Technology on Optical Radiation Lab. (China)
Shuhua Wang, Science and Technology on Optical Radiation Lab. (China)
Weiqi Jin, Beijing Institute of Technology (China)
Xia Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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