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Proceedings Paper

Characteristics of GaN material and application in UV detection
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Paper Abstract

For the characteristics such as wide bandgap, low dielectric constant, ability to bear high temperature, ability to resist radiation etc., GaN material can be used for UV solar blind detection in very rigorous environments. But for a long time, the preparation technology for GaN material has been still keeping it from being used extensively. GaN photocathode with good future is developed slowly in the field of UV detection. The key method of obtaining effective photoemission is to reduce the vacuum energy level of GaN emission surface, make it lower than bulk conduction band minimum. Negative electron affinity (NEA) GaN photocathode can convert the light under 365 nm to the photoelectrons that can be sent to the free space. The surface potential of NEA GaN photocathode is made up of two straight line sections with different slope. As the first dipole layer, [GaN(Mg):Cs] dipole brings 3.0 eV decline of the vacuum energy level, make the GaN photocathode surface obtain about -1.0 eV effective negative electron affinity. The second dipole O-Cs makes effective electron affinity reduce further to - 1.2 eV. The results show: near 37% quantum efficiency can be gotten at the wavelength 200 nm for reflection-mode GaN photocathode, and the quantum efficiency reaches up to 13% at 290 nm in transmission mode. The large quantum efficiency and high stability are very good properties for UV detection devices employing GaN photoemitter.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84192E (15 October 2012); doi: 10.1117/12.977904
Show Author Affiliations
Jianliang Qiao, Nanjing Univ. of Science and Technology (China)
Nanyang Institute of Technology (China)
Yuan Xu, Nanjing Univ. of Science and Technology (China)
Xiaohui Wang, Nanjing Univ. of Science and Technology (China)
Yunsheng Qian, Nanjing Univ. of Science and Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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