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Proceedings Paper

Analyzing of mid-frequency-errors from optical manufacture
Author(s): Guo Wen; Xiao-hui Meng; Yong-gang Wang; Ling-di Xu
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Paper Abstract

The mechanism of mid-frequency errors in optical fabrication is introduced. Based on R-C model, the effect of primary mirror with mid-frequency errors to system performance was analyzed. Its, Then, Power Spectral Density (PSD) and Zernike polynomial are discussed in the assessment of optical surface errors. Combining with given samples, the merit and demerit of obtained from Zernike polynomial and PSD were indicated: Zernike polynomial can do well in the assessment of low-frequency errors, but it would smooth mid-frequency errors and cannot figure out the value of the mid-frequency errors contained ; PSD not only figure out the value of mid-frequency errors contained, but also reveal the relation of spatial frequency and wavefront errors.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172N (15 October 2012); doi: 10.1117/12.977855
Show Author Affiliations
Guo Wen, Beijing Institute of Space Mechanics and Electricity (China)
Xiao-hui Meng, Beijing Institute of Space Mechanics and Electricity (China)
Yong-gang Wang, Beijing Institute of Space Mechanics and Electricity (China)
Ling-di Xu, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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