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Proceedings Paper

Method for design of axis-symmetrical TIR-optics with use of special quick raytracing technique
Author(s): Mikhail A. Moiseev; Egor V. Byzov; Kseniya V. Borisova; Leonid L. Doskolovich
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Paper Abstract

The new optimization method for design of LED optical elements working on the total internal reflection principle is proposed. The optimization method includes the quick raytracing technique adapted for axis-symmetrical surfaces and processing more than hundred thousand rays per second. The raytracing technique based on the approximation of the surface of revolution by a set of truncated cones is presented. As an example, the compact optical element producing uniformly illuminated circle region with angular size of 50° for an extended light source 1x1 mm is computed and simulated. The light efficiency of the designed optical element is about 91.3% and the root-mean-square error of the generated irradiance distribution is less than 10%.

Paper Details

Date Published: 18 December 2012
PDF: 7 pages
Proc. SPIE 8550, Optical Systems Design 2012, 855030 (18 December 2012); doi: 10.1117/12.977847
Show Author Affiliations
Mikhail A. Moiseev, Image Processing Systems Institute (Russian Federation)
LED Optics Design, LLC (Russian Federation)
Samara State Aerospace Univ. (Russian Federation)
Egor V. Byzov, Image Processing Systems Institute (Russian Federation)
LED Optics Design, LLC (Russian Federation)
Samara State Aerospace Univ. (Russian Federation)
Kseniya V. Borisova, Image Processing Systems Institute (Russian Federation)
LED Optics Design, LLC (Russian Federation)
Samara State Aerospace Univ. (Russian Federation)
Leonid L. Doskolovich, Image Processing Systems Institute (Russian Federation)
LED Optics Design, LLC (Russian Federation)
Samara State Aerospace Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Rolf Wartmann; Andrew P. Wood; Marta C. de la Fuente; Jean-Luc M. Tissot; Jeffrey M. Raynor; Daniel G. Smith; Frank Wyrowski; Andreas Erdmann; Tina E. Kidger; Stuart David; Pablo Benítez, Editor(s)

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