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Proceedings Paper

New measurement of the alignment of the deployable telescope
Author(s): Xuegui Feng; Chuang Li; Chao Zhao
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Paper Abstract

As one type of the deployable telescope, the deployable space telescope under researching uses tape springs as the support structure of secondary mirror. Before launch, the support structure of secondary mirror is folded, and when on orbit the structure is deployed. Usually the secondary mirror is not on the nominal position after deploying, so the alignment of the secondary mirror is needed. To achieve this we need to obtain the deployment errors. So the measuring of secondary mirror deployment errors of thus deployable telescope is an important topic. In this paper, we designed an accurate measuring system based on position sensitive detectors (PSDs) to measure the deployment errors, through measuring the six-degree-of-freedom motions of the secondary mirror. The measuring system contains 3 twodimensional PSDs, 3 laser diodes and 3 small mirrors. In order to resolve the deployment errors, the equations linking the PSD readings and the six-degree-of-freedom displacement of the secondary mirror were deduced. These equations are solved through a numerical method. Finally, we did measuring experiments on a deployable prototype. The experimental results show that this deployable prototype has deployment errors about 100um.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841735 (15 October 2012); doi: 10.1117/12.977843
Show Author Affiliations
Xuegui Feng, Xi’an Institute of Optics and Precision Mechanics (China)
Chuang Li, Xi’an Institute of Optics and Precision Mechanics (China)
Chao Zhao, Xi’an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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