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Proceedings Paper

Noise factor of microchannel plate with ion barrier film
Author(s): Shu-lin Liu; Feng Shi; Zhou-kui Li; Yu-feng Zhu; Ni Zhang; Yan Gu; Jian-ning Sun; Xiao-qing Cong; Hui-min Zhao; Jing-sheng Pan; Yun-sheng Qian; Shao-cheng Zheng; Ben-kang Chang
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Paper Abstract

According to definition of noise factor of microchannel plate and the test principle, the authors set up a test installation, and measured the numerical values of MCPs which were made of different materials and channel pore including no / with ion barrier film in input of MCP. In order to seek the technical approach to reduce noise factor of MCP at the same time, we tested and analyzed the relation between noise factor and MCP voltage, combined relation between signal-to-noise ratio of GEN Ⅲ image intensifier and MCP voltage, open out relation between signal-to-noise ratio of GEN Ⅲ image intensifier and noise factor of MCP with ion barrier film.

Paper Details

Date Published: 16 October 2012
PDF: 6 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 84162G (16 October 2012); doi: 10.1117/12.977793
Show Author Affiliations
Shu-lin Liu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Institute of High Energy Physics (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Zhou-kui Li, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Yu-feng Zhu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Ni Zhang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Yan Gu, Nanjing Univ. of Science and Technology (China)
Jian-ning Sun, Nanjing Univ. of Science and Technology (China)
Xiao-qing Cong, Nanjing Univ. of Science and Technology (China)
Hui-min Zhao, Nanjing Univ. of Science and Technology (China)
Jing-sheng Pan, Nanjing Univ. of Science and Technology (China)
Yun-sheng Qian, Nanjing Univ. of Science and Technology (China)
Shao-cheng Zheng, Nanjing Univ. of Science and Technology (China)
Ben-kang Chang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)

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