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Proceedings Paper

Study on near-field scattering characteristic based on ray-tracing
Author(s): Kaifeng Wu; Jing Ma; Hongxia Mao; Yanbing Dong
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Paper Abstract

A new arithmetic is put forward for calculating near-field scattering, which based on ray-tracing. Detailedly, targets is modeled by elementary volume elements, each contains the spectrum scattering coefficients(BRDF). When the distance between the targets and the detector changes, the light source is simulated as a spot source or surface source. In ray tracing, KD-TREE is used and adopted the CUDA multithreading programming arithmetic, which enable to tackle huge quantities of rays in complex geometric environment. The test result proves the practicability of the method.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172W (15 October 2012); doi: 10.1117/12.977637
Show Author Affiliations
Kaifeng Wu, Science and Technology on Optical Radiation Lab. (China)
Jing Ma, Science and Technology on Optical Radiation Lab. (China)
Hongxia Mao, Science and Technology on Optical Radiation Lab. (China)
Yanbing Dong, Science and Technology on Optical Radiation Lab. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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