Proceedings PaperA new method that indicates the peak stress of random vibration response
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It is an important assessment targets that make a quantitative study of the peak stress of random vibration response during the mechanical properties design process of the space payload. Based on the equivalent of the destructive effect of the random vibration peak response and sine vibration response, the paper established the link between the two, obtained the sine vibration input function that equivalent to the destructive effect of the random vibration peak response. Considering the characteristic of the quantitative research that stress of sine vibration can be, the paper analyzed the stress of the sine vibration by the finite element method and indirectly accessed to the random vibration response peak stress which equivalent to the sine vibration destructive effect.
This method worked very well to indicate the peak stress of random vibration response during the ground random vibration tests. The paper provided an effective means of predictive and validation method for the mechanical properties design and test during the ground random vibration test evaluation. The developments costs of the engineering can be significant saving and greatly shorten the development cycle by the method of the peak stress of random vibration response indicated during the ground tests. It is also helpful to improve the safety and reliability of the space load structure in order to avoid the failure or fatigue of the ground random vibration tests.
PDF: 6 pages
Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 84150E (15 October 2012); doi: 10.1117/12.977620
Peng Xie, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Guang Jin, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 8415:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)