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Proceedings Paper

The Extreme Ultraviolet Imagers (EUVIs): Earth-observing telescopes on International Space Station
Author(s): Kentaro Uji; Ichiro Yoshikawa; Kazuo Yoshioka; Go Murakami; Atsushi Yamazaki
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Paper Abstract

The Extreme Ultraviolet Imagers (EUVIs) were launched on 21st July 2012 as payloads to the Exposed Facility of the Japanese Experiment Module (JEM-EF) on the International Space Station. The EUVIs are parts of the IMAP (Ionosphere, Mesosphere, upper Atmosphere, and Plasmasphere mapping) mission to observe the Earth’s upper atmosphere, mesosphere, ionosphere, thermosphere and plasmasphere. The other part of IMAP is a visible and near-infrared spectral imager (VISI). In this mission, we install two independent and identical telescopes. One telescope detects the terrestrial EUV emission from O+ (at the wavelength of 83.4 nm), and the other one detects He+ (30.4 nm). At the altitude of approximately 400 km, the two telescopes direct towards the Earth’s limb to look at the ionosphere and plasmasphere from the inside-out. The maximum spatial resolution is 0.1° and time resolution is 1 minute. The optical instruments consist of multilayer coated mirrors which are optimized for 30.4 nm, metallic thin filters and 5-stage microchannel plates to pick up photon events efficiently. In our presentation, we report the mission overview, the instruments and the result of ground calibrations.

Paper Details

Date Published: 9 November 2012
PDF: 7 pages
Proc. SPIE 8528, Earth Observing Missions and Sensors: Development, Implementation, and Characterization II, 85281M (9 November 2012); doi: 10.1117/12.977429
Show Author Affiliations
Kentaro Uji, The Univ. of Tokyo (Japan)
Ichiro Yoshikawa, The Univ. of Tokyo (Japan)
Kazuo Yoshioka, Japan Aerospace Exploration Agency (Japan)
Go Murakami, Japan Aerospace Exploration Agency (Japan)
Atsushi Yamazaki, Japan Aerospace Exploration Agency (Japan)


Published in SPIE Proceedings Vol. 8528:
Earth Observing Missions and Sensors: Development, Implementation, and Characterization II
Haruhisa Shimoda; Xiaoxiong Xiong; Changyong Cao; Xingfa Gu; Choen Kim; A. S. Kiran Kumar, Editor(s)

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