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Proceedings Paper

Design for the correction system of the real time nonuniformity of large area-array CCD image
Author(s): Yan Wang; Chunmei Li; Ning Lei
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Paper Abstract

With the robust thriving of aviation cameras and remote sensing technology, the linear-array CCD (charge-coupled device) and area CCD have developed toward large area CCD, which has a broad coverage and avoids the difficulty in jointing small area CCDs in addition to improving time resolution. However, due to the high amount of pixels and channels of large area CCD, photo-response non-uniformity (PRNU) is severe. In this paper, a real time non-uniformity correction system is introduced for a sort of large area full frame transfer CCD. First, the correction algorithm is elaborated according to CCD’s working principle. Secondly, due to the high number of pixels and correction coefficient, ordinary chip memory cannot meet the requirement. The combination of external flash memory and DDR described in the paper satisfies large capacity memory and rapid real time correction. The methods and measurement steps for obtaining correction factors are provided simultaneously. At the end, an imaging test is made. The non-uniformity of the image is reduced to 0.38 % from the pre-correction 2.96 %, achieving an obvious reduction of non-uniformity. The result shows that the real time non-uniformity correction system can meet the demands of large area-array CCD.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84191R (15 October 2012); doi: 10.1117/12.977227
Show Author Affiliations
Yan Wang, Beijing Institute of Space Mechanics and Electricity (China)
Chunmei Li, Beijing Institute of Space Mechanics and Electricity (China)
Ning Lei, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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