Share Email Print
cover

Proceedings Paper

Integrated modeling and optical jitter analysis of a high resolution space camera
Author(s): Bowen Zhang; Xiaoyong Wang; Yongli Hu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The influence of jitter on the interface between space camera and satellite platform may cause the camera structural distortion, which will change ideal assembly and adjustment relationship of optical system, and affect the imaging quality. An integrated model of a high resolution space camera comprising reaction wheel assemblies disturbance which induced the largest jitter of spacecraft, structures and optics systems was developed in order to predict the expected dynamic performance of the camera in terms of MTF descending and image motion. The process as currently implemented uses Pro/Engineer for design, PATRAN and Hypermesh for model building and results visualization, NASTRAN for structural analysis, and Code V for optical analysis. A translator was developed in MATLAB to transfer PATRAN results to Code V optical analysis software. This jitter analysis results are used to assess image quality, improve the structural design, and mitigate the disturbance impact.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 841508 (15 October 2012); doi: 10.1117/12.976865
Show Author Affiliations
Bowen Zhang, Beijing Institute of Space Mechanics and Electricity (China)
Xiaoyong Wang, Beijing Institute of Space Mechanics and Electricity (China)
Yongli Hu, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 8415:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)

© SPIE. Terms of Use
Back to Top