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Proceedings Paper

Comparative analysis of three-position measurement technology and multi-positions average measurement technology
Author(s): Peng Yang; Fan Wu; Xi Hou
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Paper Abstract

Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error.

Paper Details

Date Published: 16 October 2012
PDF: 4 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 84162C (16 October 2012); doi: 10.1117/12.976809
Show Author Affiliations
Peng Yang, Guiyang Univ. (China)
Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Xi Hou, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)

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