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Proceedings Paper

A statistical study of the relationship between surface quality and laser induced damage
Author(s): Trey Turner; Quentin Turchette; Alex R. Martin
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Paper Abstract

Laser induced damage of optical components is a concern in many applications in the commercial, scientific and military market sectors. Numerous component manufacturers supply “high laser damage threshold” (HLDT) optics to meet the needs of this market, and consumers pay a premium price for these products. While there’s no question that HLDT optics are manufactured to more rigorous standards (and are therefore inherently more expensive) than conventional products, it is not clear how this added expense translates directly into better performance. This is because the standard methods for evaluating laser damage, and the underlying assumptions about the validity of traditional laser damage testing, are flawed. In particular, the surface and coating defects that generally lead to laser damage (in many laserparameter regimes of interest) are widely distributed over the component surface with large spaces in between them. As a result, laser damage testing typically doesn’t include enough of these defects to achieve the sample sizes necessary to make its results statistically meaningful. The result is a poor correlation between defect characteristics and damage events. This paper establishes specifically why this is the case, and provides some indication of what might be done to remedy the problem.

Paper Details

Date Published: 4 December 2012
PDF: 11 pages
Proc. SPIE 8530, Laser-Induced Damage in Optical Materials: 2012, 85300R (4 December 2012); doi: 10.1117/12.976631
Show Author Affiliations
Trey Turner, Research Electro-Optics, Inc. (United States)
Quentin Turchette, Research Electro-Optics, Inc. (United States)
Alex R. Martin, Research Electro-Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 8530:
Laser-Induced Damage in Optical Materials: 2012
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M J Soileau, Editor(s)

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