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Proceedings Paper

Physical Evaluation Of CRT's For Use In Digital Radiography
Author(s): H. Roehrig; W. Dallas; T. L. Ji; R. D. Lamoreaux; D. Oikawa; R. Vercillo; D. Yocky
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Paper Abstract

An evaluation facility has been developed, which permits precise physical evaluation of CRT's. It is designed for scanning single element detectors such as photomultipliers or silicon diodes across the active area of the CRT up to dimensions of 15" horizontally by 20" vertically in steps of 2 micrometers. Other detectors include video camera tubes and CCD's. The facility is controlled by an IBM AT compatible PC and includes an analog integrator, an 8000 channel multichannel analyzer and a Biomation 2100 waveform recorder. It is designed for precise measurements of o linearity (signal transfer curve) o contrast resolution o signal-to-noise ratio o spatial resolution (beam spot size) o granularity o phosphor decay o stability o uniformity o jitter of scan lines o line pairing The facility was used for the evaluation of the Toshiba workstation TDF 500, which uses 2 CRT's of 345 mm vertical and 230 mm horizontal dimensions each. The paper describes the facility and discusses some results of the evaluation. It also compares the merits of multi element detectors (i.e. video camera tubes) with the merits of single element detectors (i.e. photomultipliers) in the evaluation of CRT's.

Paper Details

Date Published: 8 May 1989
PDF: 17 pages
Proc. SPIE 1091, Medical Imaging III: Image Capture and Display, (8 May 1989); doi: 10.1117/12.976461
Show Author Affiliations
H. Roehrig, University of Arizona (United States)
W. Dallas, University of Arizona (United States)
T. L. Ji, University of Arizona (United States)
R. D. Lamoreaux, University of Arizona (United States)
D. Oikawa, Toshiba Corporation (Japan)
R. Vercillo, University of Arizona (United States)
D. Yocky, University of Arizona (United States)

Published in SPIE Proceedings Vol. 1091:
Medical Imaging III: Image Capture and Display
Samuel J. Dwyer III; R. Gilbert Jost M.D.; Roger H. Schneider, Editor(s)

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