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Proceedings Paper

Estimation of global ET-Index from satellite imagery for water resources management
Author(s): Masahiro Tasumi; Reiji Kimura; Masao Moriyama; Richard G. Allen; Aiko Fujii
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Paper Abstract

This paper presents the algorithm to estimate the Evapotranspiration Index (ET-Index) developed for a research product of the 1st generation of the Global Change Observation Mission satellite for the Climate (GCOM-C1) satellite of the Japan Aerospace Exploration Agency (JAXA). The ET-Index is equivalent to a widely used "Crop Coefficient" in the field of irrigation engineering, defined as the actual evapotranspiration normalized for weather conditions. The ET-Index is convertible to an actual quantity of evapotranspiration using local weather data. In the proposed method, the ET-Index is estimated primarily by the land surface temperature image of a satellite, with some additional inputs including the Digital Elevation Model (DEM) and global wind speed reanalysis data. The algorithm estimates the ET-Index by using the surface temperature as an indicator of surface wetness, employing two extreme hypothetical surface conditions called "wet surface," defined as a surface having a zero sensible heat flux, and "dry surface," defined as the surface having a zero ET. A derived ET-Index map is widely applicable for water resources management in agriculture and environmental conservation. Applications of the proposed algorithm to Landsat and MODIS thermal images showed good performances in semi-arid regions in China and the western United States.

Paper Details

Date Published: 21 November 2012
PDF: 10 pages
Proc. SPIE 8524, Land Surface Remote Sensing, 85240K (21 November 2012); doi: 10.1117/12.976283
Show Author Affiliations
Masahiro Tasumi, Univ. of Miyazaki (Japan)
Reiji Kimura, Tottori Univ. (Japan)
Masao Moriyama, Nagasaki Univ. (Japan)
Richard G. Allen, Univ. of Idaho (United States)
Aiko Fujii, Univ. of Miyazaki (Japan)


Published in SPIE Proceedings Vol. 8524:
Land Surface Remote Sensing
Dara Entekhabi; Yoshiaki Honda; Haruo Sawada; Jiancheng Shi; Taikan Oki, Editor(s)

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