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Proceedings Paper

Measuring system for cable length and diameter based on photoelectric technology
Author(s): WeiMin Zhu; Zhou Zhou; Ping Wei; Fang Qi
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Paper Abstract

Precise online measurement of cable diameter and length will ensure stability of quality production and production speed. This paper describes a measuring device to measure cable length and diameter simultaneously, accomplish online production process control. The device consists mainly of a synchronous sampling part, calculation and control part. The synchronous sampling part consists of two parallel rollers one meter far from each other. A measuring band cinctures the rollers and move together with them. There are two electromagnetic chucks on the measuring band which are controlled by two photoelectric position switches to hold or release a cable, in order to make the cable move with measuring system synchronously. An optical encoder is connected to one of the rollers coaxially to measure cable length. For cable diameter measurement, two orthogonal CCD sensors are used. Accuracy of online diameter measurement is mainly affected by vibration of cable movement. In order to reduce the cable diameter measurement error caused by vibration, measuring system uses a mechanical damping device and high-speed CCD sensors which exposure time is up to microseconds. The calculation and control part of measuring device can filter, amplify and binarizate electrical signals from synchronous sampling part, then they are processed by microcontroller 8051 to complete cable length and diameter measurement. As well, the measuring device can set error limits and detect online whether cable length and diameter size are in default range , if not it would give corresponding alarm.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172T (15 October 2012); doi: 10.1117/12.976277
Show Author Affiliations
WeiMin Zhu, Beijing Univ. of Technology (China)
Henan Institute of Metrology (China)
Zhou Zhou, Zhengzhou Univ. (China)
Ping Wei, Henan Institute of Metrology (China)
Fang Qi, Henan Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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