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Proceedings Paper

A New Surface Measuring Technique Using Phase Retrieval By Amplitude Interferometry
Author(s): Bobby L. Ulich; Christopher K. Walker; Constance E. Philips-Walker; Warren B. Davison; John H. Davis; Charles E. Mayer
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Paper Abstract

A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.

Paper Details

Date Published: 12 May 1986
PDF: 8 pages
Proc. SPIE 0608, Optical Alignment III, (12 May 1986); doi: 10.1117/12.976192
Show Author Affiliations
Bobby L. Ulich, University of Arizona (United States)
Christopher K. Walker, University of Arizona (United States)
Constance E. Philips-Walker, University of Arizona (United States)
Warren B. Davison, University of Arizona (United States)
John H. Davis, The University of Texas at Austin (United States)
Charles E. Mayer, The University of Texas at Austin (United States)


Published in SPIE Proceedings Vol. 0608:
Optical Alignment III
Mitchell C. Ruda, Editor(s)

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