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Proceedings Paper

Laser Measurement Techniques - Laser Spectroscop In Semiconductors
Author(s): E. D. Jones; G. L. Wickstrom
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Paper Abstract

A CAMAC-based digital data acquisition system to study luminescence spectra and dynamics in semiconductors using pulsed and cw laser sources is described. Various experimental techniques for measuring time-dependent luminescence and laser excitation spectra are discussed. In order to demonstrate the system performance and sensitivity of this data acquisition system, experimental low-temperature laser-induced luminescence data for the oxygen-bound exciton in the II-VI semiconductor compound ZnTe is presented.

Paper Details

Date Published: 20 November 1985
PDF: 6 pages
Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985); doi: 10.1117/12.976138
Show Author Affiliations
E. D. Jones, Sandia National Laboratories (United States)
G. L. Wickstrom, Sandia National Laboratories (United States)


Published in SPIE Proceedings Vol. 0540:
Southwest Conf on Optics '85
Susanne C. Stotlar, Editor(s)

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