Share Email Print

Proceedings Paper

Dynamic Picosecond Reflectivity Studies Of Highly Optically-Excited Crystalline Silicon
Author(s): Thomas F. Boggess; Arthur L. Smirl; K. Bohnert; Kamjou Mansour; Steven C. Moss; Ian W. Boyd
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Recent interest in picosecond Si optical limiters that can operate above the fluence required to melt the Si surface has lead us to the first detailed investigation of the nonlinear reflectivity of this semiconductor at 1-micron for fluences near and just above the melting threshold. Conventional reflectivity measurements at this wavelength are inconsistent with similar measurements at 532 nm and apparently indicate that the Si surface melts hundreds of picoseconds after the passage of the 48 ps (FWHM) pulse. Spatial correlation and time-resolved surface imaging shows that melting actually occurs during the pulse and the apparent delayed melting results from material evaporation. Discrepancies between measurements at 1-micron and those in the visible are resolved in terms of material evaporation, the weak wavelength dependence of the liquid Si absorption, and the dramatically different melting thresholds for these two wavelengths.

Paper Details

Date Published: 20 November 1985
PDF: 6 pages
Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985); doi: 10.1117/12.976104
Show Author Affiliations
Thomas F. Boggess, North Texas State University (United States)
Arthur L. Smirl, North Texas State University (United States)
K. Bohnert, North Texas State University (United States)
Kamjou Mansour, North Texas State University (United States)
Steven C. Moss, North Texas State University (United States)
Ian W. Boyd, North Texas State University (United States)

Published in SPIE Proceedings Vol. 0540:
Southwest Conf on Optics '85
Susanne C. Stotlar, Editor(s)

© SPIE. Terms of Use
Back to Top