Share Email Print
cover

Proceedings Paper

Verification of the numerical aperture of laser scanning confocal microscope objective
Author(s): Yushu Shi; Richard K. Leach; Claudiu L. Giusca; Sitian Gao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Laser scanning confocal microscopy (LSCM) is definitely a new 3D imaging system combined with modern optical and electrical technology. It differs from conventional microscopes in that the pinhole makes LSCM have the ability to acquire in-focus images from selected depths – a process known as optical sectioning. Like all of the microscope optical systems, the numerical aperture (NA) is a very important character of objective, which directly relate to the lateral resolution of the microscope system. A verification method for NA of LSCM is discussed in this paper based on the definition of NA. In this method, an appropriate sphere is measured by LSCM. The verified NA value is deduced from the measured maximum spherical crown in accordance with reasonabe analysis process. Consequently, this method is approved to be simple enough to practice by many times experiments.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180D (15 October 2012); doi: 10.1117/12.975942
Show Author Affiliations
Yushu Shi, National Institute of Metrology (China)
National Physical Lab. (United Kingdom)
Richard K. Leach, National Physical Lab. (United Kingdom)
Claudiu L. Giusca, National Physical Lab. (United Kingdom)
Sitian Gao, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Song Hu; Yanqiu Li; Xiangang Luo; Xiaoyi Bao, Editor(s)

© SPIE. Terms of Use
Back to Top