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Proceedings Paper

Design of the displacement platform for the life test system of the space infrared device
Author(s): Xianliang Zhu; Xiangrong He; Haiyan Zhang; Lan Cao; Haimei Gong
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Paper Abstract

In the life test of space infrared detector, it was unable to periodically measure blackbody response signal of infrared detectors conveniently, due to equipment limitations for a long time. Accordingly, it was also unable to get abundant failure data of devices for statistical analysis. For this problem, we have designed a new multi-station structure, in which automatic test of signal can be carried out on life test site. The displacement platform is the key component to achieve automatic test. By theoretical analysis of parameters which affect response signal and actual test data analysis, we studied and designed the displacement platform, and put up indexes of displacement platform which meet the system requirements well. Indexes of the rotating stage are: repeat positioning accuracy <9.5×10-4° , radial run-out <10 um, face run-out <20 um. Indexes of the translation stage are: repeat positioning accuracy <10 um, straightness <10 um, flatness< 20 um. And the blackbody pitch angle should be controlled within less than 1°. This design well prepared for the development of automatic test system of infrared detector photoelectric properties.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841734 (15 October 2012); doi: 10.1117/12.975929
Show Author Affiliations
Xianliang Zhu, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xiangrong He, Shanghai Institute of Technical Physics (China)
Haiyan Zhang, Shanghai Institute of Technical Physics (China)
Lan Cao, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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