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Proceedings Paper

New half-film method for measuring Al2O3 film MTF of 3rd generation image intensifier
Author(s): Yaojin Cheng; Feng Shi; Xiaofeng Bai; Yufeng Zhu; Lei Yan; Feng Liu; Min Li
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Paper Abstract

In 3rd generation image intensifier, Al2O3 film on the input of MCP is a serious influence factor on device MTF due to its electron scattering process. There are no reportes about how to measure the MTF of Al2O3 film. In this paper a new Half-film comparssion test method is creatively established for determing the film MTF, which overcomes the difficulty of measuring super thin film less than a few nm. In this way, the MTF curves of 10nm Al2O3 film can be accurately obtained. The measurement results show that 10nm Al2O3 film obviously decay the MTF performance of the 3rd generation image intensifier and take an important role in the improvement work of 3rd generation image intensifier MTF and resolution performances.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170G (15 October 2012); doi: 10.1117/12.975927
Show Author Affiliations
Yaojin Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Xiaofeng Bai, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Yufeng Zhu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Lei Yan, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Feng Liu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)
Min Li, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co. Ltd (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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