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Proceedings Paper

Photon-counting image assessment based on standard mutual information using improved 2D entropy
Author(s): Ruiqing He; Qian Chen; Yaojin Chen; Wei Cheng; Weiji He
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Paper Abstract

Traditional assessment methods don’t fit for photon-counting image (PCI) system because the output of PCI system is the number of photon instead of the gray value. Normalized mutual information is presented to assess Photon-counting image system performance and calculated based on improved 2D entropy for PCI system to provide the fidelity of PCI system. Probabilities of target classification error are introduced by Bayesian posterior probability classification method under the different fidelity conditions and the result confirms fidelity values. This method applied in the PCI experiments can reflect image fidelity and system performance well in different experiment conditions and supplies the evidences for assessing the quality for photon-counting image.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841717 (15 October 2012); doi: 10.1117/12.975826
Show Author Affiliations
Ruiqing He, National Key Lab. of Science and Technology on Low Light Level Night Vision (China)
Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Yaojin Chen, National Key Lab. of Science and Technology on Low Light Level Night Vision (China)
Wei Cheng, National Key Lab. of Science and Technology on Low Light Level Night Vision (China)
Weiji He, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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