Share Email Print
cover

Proceedings Paper

Co-phasing measurement for segmented mirrors and image retrieval technology based on phase diversity
Author(s): Qun Luo; Yu Ning; Lin-hai Huang; Nai-ting Gu; Chang-Hui Rao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In order to improve the imaging resolution of a segmented telescope, the co-phasing error of segmented mirrors must be accurately measured and corrected. Phase Diversity (PD) refers to a technique of image-based wavefront sensing, and it could estimate both the unknown phase parameters and the unknown object. In this paper, the Phase diversity is proposed to measure the co-phasing errors and retrieve the unknown object for segmented mirrors, and the performance of this technique is simulated for point source and extended source. The simulation results demonstrate that the Phase Diversity Wavefront Sensor (PD WFS) can synchronously measure the piston errors of multi-segmented mirrors and the quality of the retrieved image is much better than before. The Phase Diversity Wavefront Sensor can be used to measure the co-phasing errors and retrieve the unknown object for the segmented mirror system.

Paper Details

Date Published: 15 October 2012
PDF: 9 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84171Y (15 October 2012); doi: 10.1117/12.975815
Show Author Affiliations
Qun Luo, Institute of Optics and Electronics (China)
National Univ. of Defense Technology (China)
Yu Ning, National Univ. of Defense Technology (China)
Lin-hai Huang, Institute of Optics and Electronics (China)
Nai-ting Gu, Institute of Optics and Electronics (China)
Chang-Hui Rao, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top