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Proceedings Paper

An automatic measuring system for the lifetime testing of infrared detectors
Author(s): Lan Cao; Haiyan Zhang; Xianliang Zhu; Haimei Gong
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Paper Abstract

In this paper, an automatic measuring system based on LABVIEW and PLC is introduced; it uses the mutual controls of Single-Chip computer (MCU) and LABVIEW to accomplish the electrical parameter measurements of infrared detectors. This system can realize the multiple parameter measurements of no less than 160 IR detectors, it can realize the collection and storage of results by the LABVIEW; and it can avoid the damage of the IR detector during the measurement. After thousands times of test, the results show that the system runs stably and it can meet the accurate parameter measurement of detector.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84191O (15 October 2012); doi: 10.1117/12.975762
Show Author Affiliations
Lan Cao, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Haiyan Zhang, Shanghai Institute of Technical Physics (China)
Xianliang Zhu, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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