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Proceedings Paper

Speckle interferometry based on spatial fringe analysis method using only two speckle patterns
Author(s): Yasuhiko Arai; Takuya Inoue; Shunsuke Yokozeki
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Paper Abstract

Electronic speckle pattern interferometry is a useful deformation measurement method. In this paper, new speckle interferometry that can measure the deformation with a concave shape distribution based on spatial fringe analysis method by using only two speckle patterns is proposed. The optical system that can record some spatial information into each speckle of speckle pattern is set up by using basic characteristics of speckle phenomenon that has never been used before. In experimental results, it is confirmed that the out-of-plane deformation measurement by using only two speckle patterns before and after the deformation can be precisely performed by this method.

Paper Details

Date Published: 11 September 2012
PDF: 6 pages
Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84130F (11 September 2012); doi: 10.1117/12.975753
Show Author Affiliations
Yasuhiko Arai, Kansai Univ. (Japan)
Takuya Inoue, Kansai Univ. (Japan)
Shunsuke Yokozeki, Jyoukou Applied Optics Lab. (Japan)


Published in SPIE Proceedings Vol. 8413:
Speckle 2012: V International Conference on Speckle Metrology
Ángel Fernandez Doval; Cristina Trillo, Editor(s)

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