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Proceedings Paper

Cylindrically symmetric vector beams obtained by overlapping optical vortices
Author(s): ZhengYue Zong; Neimule Menke; Ming Cheng; Bin Bo; ChuYi Hua; Ke Ji; BaoLi Yao
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Paper Abstract

In recent years, cylindrically symmetric vector beams are widely used in many fields, such as high-resolution microscopy, micro printing and nonlinear optics et al. The intensity and polarization of cylindrically symmetric vector beams are symmetrical around the optical axis. Radially polarized beam and azimuthally polarized beam are the most common cylindrically symmetric vector beams. In this paper, first by using numerical methods it is calculated that the cylindrically symmetric vector beams can be obtained by overlapping two optical vortices or by overlapping an optical vortices with topological charge of two and a plane wave. Then, a radially polarized beam and azimuthally polarized beam were experimentally obtained by overlapping a right-circularly polarized plane light and a left-circularly polarized optical vortices with topological charge of two, which is obtained by using a reflective liquid crystal spatial light modulator (SLM) and a quarter-wave plate. The experimental results show that, by using this method, different kinds of cylindricany symmetric vector beams can be obtained very simply and easily, and could be switched to each other at video rate, and has higher energy conversion efficiency (up to 60%).

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841708 (15 October 2012); doi: 10.1117/12.975742
Show Author Affiliations
ZhengYue Zong, Inner Mongolia Univ. (China)
Neimule Menke, Inner Mongolia Univ. (China)
Ming Cheng, Inner Mongolia Univ. (China)
Bin Bo, Inner Mongolia Univ. (China)
ChuYi Hua, Inner Mongolia Univ. (China)
Ke Ji, Inner Mongolia Univ. (China)
BaoLi Yao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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