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Proceedings Paper

Electrical properties of black silicon
Author(s): Zhengxi Cheng; Yongping Chen; Bin Ma
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Paper Abstract

Black silicon thin films with supersaturated heavily doped sulfur were fabricated on silicon substrates through femtosecond laser scanning the silicon substrate surface in SF6 atmosphere. The temperature characteristics of the carrier concentration and mobility of the two-layer structure, black silicon films/silicon substrate, were measured with variable temperature Hall test methods within the 15-300 K temperature range. Numerical empirical model of carrier mobility and carrier concentration of impurity ionization model were used to fit the temperature characteristics of the carrier concentration and mobility of the two-layer structure, black silicon films/silicon substrate at the same time. The properties of each layer were separated from the measured results. Activation energy Eds was 0.0174 eV, the active sulfur impurity concentration was 3.2903×1019 cm-3, the concentration of the substrate doped with phosphorus Ndb was 3.4030×1014 cm-3, activation energy of the substrate doped with phosphorus Edb was 0.0483 eV.Activation energy of the substrate doped with phosphorus Edb and concentration Ndb were close to the actual measured values,therefore the fitting was effective. Active sulfur concentration in the Black silicon film was very high, and carrier activation energy was very low, so carrier concentration was weakly related with temperature. Carrier mobility was also weakly related with temperature. Black silicon was close to the metal-insulation transition critical point.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 841918 (15 October 2012); doi: 10.1117/12.975674
Show Author Affiliations
Zhengxi Cheng, Shanghai Institute of Technical Physics (China)
Yongping Chen, Shanghai Institute of Technical Physics (China)
Bin Ma, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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