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Proceedings Paper

Optical bidirectional force sensor using optical planar waveguide
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Paper Abstract

We demonstrate an optical planar waveguide sensor that can be used to measure the direction and intensity of physical force. The interferometric structure, on which the proposed sensor is based, introduces an interference pattern in wavelength. Its phase is shifted by the external force. On the other hand, since the cross-sectional effective refractive index profile is asymmetric because of the core formed on one side of silica substrate, the phase shift appears with respect to the direction of the external force against the surface. Therefore, we can measure the direction and intensity of the applied force by monitoring the phase change.

Paper Details

Date Published: 17 October 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84213H (17 October 2012); doi: 10.1117/12.975670
Show Author Affiliations
Myoung Jin Kim, Korea Photonics Technology Institute (Korea, Republic of)
Eun Joo Jung, Korea Photonics Technology Institute (Korea, Republic of)
Sung Hwan Hwang, Korea Photonics Technology Institute (Korea, Republic of)
Woo-Jin Lee, Korea Photonics Technology Institute (Korea, Republic of)
Byung Sup Rho, Korea Photonics Technology Institute (Korea, Republic of)


Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)

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