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Proceedings Paper

Research on eliminating high-order spectrum in broadband miniature spectrometer system
Author(s): Kang Liu; Feihong Yu
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Paper Abstract

A dispersion spectrum order distribution model is established in order to eliminate the overlapping of broadband spectrum range among various dispersion orders in grating devices and the micro-array detector based miniature spectrometer system. Both step filters and the numeric filter are, respectively, designed to eliminate the high-order spectrum in such system. For the step-filter method, a novel filter design is introduced. The evaluation function of the design parameters is defined. Two kinds of step-filter are designed and manufactured by lithography and thin film coating. For the numeric-filter method, a calculation method of deducing the high-order spectra data is illustrated. The accuracy of this method depends on the measurement of diffraction efficiency ratio. A new measurement method based on Deuterium-Halogen light source and short-pass filter is accomplished. Both Mercury-Argon lamp and Tungsten Halogen lamp are used to verify the effect of these two methods. And the results show that both methods have notable effects in eliminating high-order spectra of broadband miniature spectrometer systems. The step-filter method is a physical method and has an advantage of real-time input and output. The numeric filter is a calculation method that does not reduce the intensity of the spectrum. Currently, the numeric filter method can be seen to have certain advantages compared with step-filter method used in broadband miniature spectrometer systems with wavelength range of visible to near-infrared.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 841506 (15 October 2012); doi: 10.1117/12.975647
Show Author Affiliations
Kang Liu, Zhejiang Univ. (China)
Feihong Yu, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 8415:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)

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