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Proceedings Paper

Two-Line-Coupling Beam-Quality Effects In Stimulated Raman Scattering
Author(s): R. B. Holmes; A. Flusberg
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Paper Abstract

We present the results of calculations of the beam quality obtainable in a collimated, single-beam Raman beam cleanup system, in which the pump laser contains two lines whose frequency separation is enough to cause significant dispersive "slip" between them in the Raman amplifier. A specific example is the 351-353 nm line pair of an XeF laser. We start from equations coupling the various modes of the lines and their corresponding Stokes modes. Refractivity effects caused by nonuniform Raman--induced population transfer are specifically accounted for. The impact on beam quality is assessed as a function of the pressure in a H2 Raman amplifier, and it is shown that the minimum effect occurs at a pressure of 2.4 Atm, for which the motionally narrowed Raman linewidth takes its minimum value. The two-line coupling causes the population transfer due to the stronger of the two lines to adversely affect the beam quality of the weaker line. For an rms percent fluence modulation of 15 percent, the two-line coupling lowers the Strehl ratio (a measure of beam quality) by ~15 percent for a 1-μs XeF laser pulse length.

Paper Details

Date Published: 25 November 1986
PDF: 6 pages
Proc. SPIE 0642, Modeling and Simulation of Optoelectronic Systems, (25 November 1986); doi: 10.1117/12.975492
Show Author Affiliations
R. B. Holmes, Avco Research Laboratory (United States)
A. Flusberg, Avco Research Laboratory (United States)

Published in SPIE Proceedings Vol. 0642:
Modeling and Simulation of Optoelectronic Systems
John Dugan O'Keefe, Editor(s)

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