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Proceedings Paper

Sources Of Noise In High-Resolution Screen-Film Radiography
Author(s): Phillip C. Bunch; Kenneth E. Huff; Richard Van Metter
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Paper Abstract

The contrast transfer function (CTF), noise power spectrum (NPS), noise equivalent quanta (NEQ), and detective quantum efficiency (DQE) of a high-resolution screen-film combination have been measured for exposure to a 30 kVp x-ray spectrum. In addition to these overall system characteristics, selected component sources of noise in the screen-film combination have been determined experimentally. These data are interpreted in terms of a simple model which is used to predict screen-film NPS, NEQ, and DQE. Reasonable agreement between model predictions and experimental measurements has been found.

Paper Details

Date Published: 12 June 1986
PDF: 12 pages
Proc. SPIE 0626, Application of Optical Instrumentation in Medicine XIV and Picture Archiving and Communication Systems, (12 June 1986); doi: 10.1117/12.975378
Show Author Affiliations
Phillip C. Bunch, Eastman Kodak Company (United States)
Kenneth E. Huff, Eastman Kodak Company (United States)
Richard Van Metter, Eastman Kodak Company (United States)


Published in SPIE Proceedings Vol. 0626:
Application of Optical Instrumentation in Medicine XIV and Picture Archiving and Communication Systems
Samuel J. Dwyer; Roger H. Schneider, Editor(s)

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