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Proceedings Paper

Stereometric Quality Of Scanning Electron Microscope Imagery
Author(s): J. D. Eick; L. N. Johnson; R. F. McGivern
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Paper Abstract

The recent development of the scanning electron microscope (SEM) has added a new dimension to the field of microscopy. The SEM produces an image having considerable depth of focus; for example, approximately 400 times that of a light microscope at equivalent magnifications. It can be operated continuously between magnifications of 20 and 100,000X with a resolution of approximately 100 Å.

Paper Details

Date Published: 1 June 1971
PDF: 12 pages
Proc. SPIE 0026, Quantitative Imagery in the Biomedical Sciences I, (1 June 1971); doi: 10.1117/12.975334
Show Author Affiliations
J. D. Eick, School of Dentistry (United States)
L. N. Johnson, Univ. of W. Ont. (United Kingdom)
R. F. McGivern, Bausch and Lomb Co. (United States)

Published in SPIE Proceedings Vol. 0026:
Quantitative Imagery in the Biomedical Sciences I
Robin E. Herron, Editor(s)

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