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Proceedings Paper

Field trials of fiber Bragg grating settlement sensors in high-speed railways
Author(s): Xianglin Lu; Yuan Gong; Xiangliang Zheng; Lei Du; Yu Wu; Dengyong Li; Li Liu; Yao Yao; Song Xiao; Zhong Deng; Yunjiang Rao
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Paper Abstract

Novel fiber Bragg gratings (FBG) based settlement sensors are developed and the sensing performance is evaluated in both the lab and field environments. The settlement is determined by precisely measuring the pressure of the water level difference. The experimental results indicated that the sensor has good linearity, good repeatability and high accuracy in the settlement measurements. The influence of temperature fluctuations on the sensor's performance is eliminated and long-term test results proved the good stability of better than ±0.1% of the sensor. Such a FBG sensing system has been applied to monitor the settlement of high-speed railways in practice.

Paper Details

Date Published: 7 November 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 8421BL (7 November 2012); doi: 10.1117/12.975243
Show Author Affiliations
Xianglin Lu, Univ. of Electronic Science and Technology of China (China)
Yuan Gong, Univ. of Electronic Science and Technology of China (China)
Xiangliang Zheng, Univ. of Electronic Science and Technology of China (China)
Lei Du, Univ. of Electronic Science and Technology of China (China)
Yu Wu, Univ. of Electronic Science and Technology of China (China)
Dengyong Li, Univ. of Electronic Science and Technology of China (China)
Li Liu, Univ. of Electronic Science and Technology of China (China)
Yao Yao, Univ. of Electronic Science and Technology of China (China)
Song Xiao, Univ. of Electronic Science and Technology of China (China)
Zhong Deng, Univ. of Electronic Science and Technology of China (China)
Yunjiang Rao, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)

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