Share Email Print

Proceedings Paper

Comparison of vibration measurements in composite materials using different types of polarimetric sensors
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Low frequency vibration measurements in a composite material using embedded polarimetric sensor are presented in this paper. A glass fiber reinforced composite material sample is fabricated with two different polarimetric sensor types embedded in it. The two types of polarimetric sensors embedded are based on polarization maintaining photonic crystal fiber (PM-PCF) and Panda fiber. The vibration frequencies and amplitudes are measured using the embedded polarimetric sensors and the results from both sensor types are compared. Analysis of the limitations of Panda fiber based vibration measurements over PM-PCF is carried out and the results are presented. It is found that for high amplitude vibration measurements, PMPCF based sensors offer a wider linear range and are more suitable than Panda fiber based polarimetric fiber sensors. It is envisaged that the results from the studies will provide important information to end-users for selecting an appropriate sensor for vibration measurements in composite materials.

Paper Details

Date Published: 7 November 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842178 (7 November 2012); doi: 10.1117/12.975159
Show Author Affiliations
Manjusha Ramakrishnan, Dublin Institute of Technology (Ireland)
Ginu Rajan, The Univ. of New South Wales (Australia)
Yuliya Semenova, Dublin Institute of Technology (Ireland)
Tomasz Wolinski, Warsaw Univ. of Technology (Poland)
Gerald Farrell, Dublin Institute of Technology (Ireland)

Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)

© SPIE. Terms of Use
Back to Top