Share Email Print

Proceedings Paper

Ultra-high resolution real-time optical fiber strain sensor using a sideband interrogation method
Author(s): Qingwen Liu; Tomochika Tokunaga; Zuyuan He
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report a novel sideband interrogation method to measure the resonance frequency difference between optical resonators. The laser carrier and a special designed sideband are simultaneously locked to the resonance frequencies of two sensor heads, respectively. Based on this method, an ultra-high resolution optical fiber real-time strain sensor system is built using a pair of identical fiber Fabry-Perot interferometers. A strain resolution of 0.05 nano-strain is demonstrated experimentally, and the measuring frequency is 7 Hz.

Paper Details

Date Published: 17 October 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84214Q (17 October 2012); doi: 10.1117/12.974969
Show Author Affiliations
Qingwen Liu, The Univ. of Tokyo (Japan)
Tomochika Tokunaga, The Univ. of Tokyo (Japan)
Zuyuan He, The Univ. of Tokyo (Japan)

Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)

© SPIE. Terms of Use
Back to Top