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Proceedings Paper

Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source
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Paper Abstract

Here we report on the effort to develop a hard x-ray grating interferometry technique for application to hard x-ray optics and wavefront characterization at the Advanced Photon Source (APS), Argonne National Laboratory, USA. We will mention the motivation for developing an x-ray interferometer at the APS and discuss the design of the interferometer. We will also describe the efforts in fabricating 2-D gratings and a new type of grating having nanometer periods for high-energy x-ray applications. The preliminary results obtained using x-ray Talbot interferometers built at APS, using a broadband (pink) beam and a monochromatic beam demonstrate the importance of this tool as a metrology instrument for optics and beam wavefront diagnostics.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8501, Advances in Metrology for X-Ray and EUV Optics IV, 85010J (15 October 2012); doi: 10.1117/12.974896
Show Author Affiliations
Shashidhara Marathe, Argonne National Lab. (United States)
Michael J. Wojcik, Argonne National Lab. (United States)
Naresh G. Kujala, Argonne National Lab. (United States)
Albert T. Macrander, Argonne National Lab. (United States)
Han H. Wen, National Institutes of Health (United States)
Chian Liu, Argonne National Lab. (United States)
Kamel Fezzaa, Argonne National Lab. (United States)
Ralu Divan, Argonne National Lab. (United States)
Derrick C. Mancini, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 8501:
Advances in Metrology for X-Ray and EUV Optics IV
Lahsen Assoufid; Peter Z. Takacs; Anand Krishna Asundi, Editor(s)

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