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Proceedings Paper

Determination of range parameters of observation devices
Author(s): J. Bareła; M. Kastek; K. Firmanty; P. Trzaskawka; R. Dulski; J. Kucharz
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Paper Abstract

Range parameters of observation devices can be determined on the basis of numerical simulations (NVTherm) or on the basis of measured characteristics. Those measurements can be conducted in both laboratory and field conditions. It is, however, difficult to carry on reliable field measurements of range parameters because they are strongly depended on atmospheric conditions. Thus the laboratory measurements are more favorable option. Analysis of literature and catalogue specifications reveal, that range parameters are given mainly on the basis of Johnson criteria or TTP model. The Johnson criteria has been used since the 50s and most of catalogue range specifications are determined according to it. There are also NATO standards, which describe the measurement procedures and methodology required to define the detection, recognition and identification ranges for standard NATO targets. For the determination of range parameters the following device characteristics must be known: minimal resolvable temperature for thermal imaging devices and minimal resolvable contrast for VIS devices. The TTP model offers a new approach to the determination of range characteristics of observation devices. It has been developed by U.S. Army’s Night Vision and Electronic Sensors Directorate since the year 2000. It was created because the modified Johnson criteria did not yield reliable results in case of modern systems with digital image processing. In order to determine the range parameters using TTP model, the modulation transfer function MTF, presample MTF function, and 3D noise of a tested system must be known as well as its basic design data as optical magnification and display type. The paper describes the measurement stand, measurement methodology and the procedure for the determination of range parameters. The results for thermal and VIS cameras are also presented, and they are analyzed and compared with the results obtained from current methods, including the measurement uncertainty figures. Some suggestions on the methodology of measurements are also given.

Paper Details

Date Published: 24 October 2012
PDF: 10 pages
Proc. SPIE 8541, Electro-Optical and Infrared Systems: Technology and Applications IX, 85411D (24 October 2012); doi: 10.1117/12.974487
Show Author Affiliations
J. Bareła, Military Univ. of Technology (Poland)
M. Kastek, Military Univ. of Technology (Poland)
K. Firmanty, Military Univ. of Technology (Poland)
P. Trzaskawka, Military Univ. of Technology (Poland)
R. Dulski, Military Univ. of Technology (Poland)
J. Kucharz, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 8541:
Electro-Optical and Infrared Systems: Technology and Applications IX
David A. Huckridge; Reinhard R. Ebert, Editor(s)

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