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Proceedings Paper

Parameter optimization of Dome A site testing DIMM by data mining
Author(s): Lingzhe Xu; Chong Pei
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Paper Abstract

The extreme environment of Antarctic is valuable for astronomical observations. Dome C is proved has excellent seeing and transmission by site testing works. While the higher, colder inland plateau Dome A is widely predicted as even better astronomical site than Dome C. Preliminary site testing developed since the beginning of 2008 shows that Dome A has lower boundary layer and lower precipitable water vapour. Now the automated seeing monitor is urgently needed to quantify the site's optical character which is necessary for the telescope design and deployment. In addition, it has the requirement that DIMM must realize automatic measurement for nearly one year under the case of unmanned intervention during which a great quantity of data will be generated because of the limitation of Dome A. This paper aims at researching how to use the method of mining association rules to automatically analyze observation data, what the relationship between various parameters effecting on optical quality is, and improving the efficiency of telescope observation by parameter optimization. We have modified a commercial telescope with diameter of 35cm to function as site testing DIMM which has been installed at XingLong observation station of National Astronomical Observatories, Chinese Academy of Sciences, acquired long term observation data, and identified that this method is suitable for optimizing the parameters of DIMM system.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200M (15 October 2012); doi: 10.1117/12.974362
Show Author Affiliations
Lingzhe Xu, Nanjing Institute of Astronomical Optics & Technology (China)
Chong Pei, Nanjing Institute of Astronomical Optics & Technology (China)
Graduate Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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