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Proceedings Paper

Research of the effects of TEC on UFPA noise performance
Author(s): Qiao Jiang; Guangzhong Xie; Lixia Xiong; Baobin Liao; Longcheng Que; Yun Zhou; Jian Lv
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Paper Abstract

Infrared detection technology plays a more and more important role in military and business. Uncooled infrared focal plane array (UFPA) is a kind of thermal detector, which detects the infrared radiation of target through the microbolometer’s photoelectric conversion. Based on the thermal model of UFPA, stable and accordant substrate temperature of microbolometer array is extreme important to improve the UFPA’s noise performance. After researching the effects of substrate temperature act on UFPA’s noise performance and responsivity, a low noise data capture system with TEC controller for UFPA is designed. And a 320x240 microbolometer array’s noise is tested with this system. With the TEC controller, the substrate temperature fluctuates at a margin of only 0.006 ºC. The test result shows that a 12.1% decrease in RMS noise, a 14.5% decrease in FPN noise and improvement of responsivity non-uniformity over time have been obtained after using TEC controller in UFPA.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 841923 (15 October 2012); doi: 10.1117/12.974301
Show Author Affiliations
Qiao Jiang, Univ. of Electronic Science and Technology of China (China)
Guangzhong Xie, Univ. of Electronic Science and Technology of China (China)
Lixia Xiong, Univ. of Electronic Science and Technology of China (China)
Baobin Liao, Univ. of Electronic Science and Technology of China (China)
Longcheng Que, Univ. of Electronic Science and Technology of China (China)
Yun Zhou, Univ. of Electronic Science and Technology of China (China)
Jian Lv, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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