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Proceedings Paper

Research on the technology for processing errors of photoelectric theodolite based on error design idea
Author(s): Xiaosong Guo; Pengcheng Pu; Zhaofa Zhou; Kunming Wang
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Paper Abstract

The errors existing in photoelectric theodolite were studied according to the error design idea , that is,the correction of theodolite errors was achieved by analyzing the effect of errors actively instead of processing the data with error passively. Aiming at the shafting error, the relationship between different errors was analyzed by the error model based on coordinate transformation, and the real-time error compensation method based on the normal-reversed measuring method and levelness auto-detection was supposed. As to the eccentric error of dial, the idea of eccentric residual error was presented and its influence to measuring precision was studied, then the dynamic compensation model was build, so the influence of eccentric error of dial to measuring precision can be eliminated. For the centering deviation in the process of measuring angle, the compensation method based on the error model was supposed, in which the centering deviation was detected automatically based on computer vision. The above method based on error design idea reduced the influence to measuring result by software compensation method effectively, and improved the automation degree of azimuth angle measuring of theodolite, at the same time the precision was not depressed.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841727 (15 October 2012); doi: 10.1117/12.974271
Show Author Affiliations
Xiaosong Guo, Xi’an Research Institute of High Technology (China)
Pengcheng Pu, Xi’an Research Institute of High Technology (China)
Zhaofa Zhou, Xi’an Research Institute of High Technology (China)
Kunming Wang, Xi’an Research Institute of High Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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