Share Email Print
cover

Proceedings Paper

Photogrammetric scale-bar measurement method based on microscopic image aiming
Author(s): Xiao-chuan Gan; Ming-zhao He; Lian-fu Li; Xiao-you Ye; Jian-shuang Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In close-range photogrammetry, a length scale of photogrammetric system was given by a scale-bar. To achieving a precision result which uncertainty is less than 10 micrometers, the uncertainty of scale-bar measurement should be less than 3 micrometers. For this purpose, an approach was proposed according to the feature of retroreflective target (RRT) on scale-bar; a measurement system consisted of a high resolution CCD camera, a laser interferometer and the lights was established. The RRTs at two ends of the scale-bar was aimed by the CCD camera. The distance between two aiming positions was measured by the laser interferometer. In this paper, a linear direct measurement model was founded; an algorithm calculating RRT's gray centroid was presented. A series of tests were carried out under different light, different illuminance and different aiming method respectively. The results indicated that the uncertainty satisfying the request of scale-bar measurement in close-range photogrammetry.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170A (15 October 2012); doi: 10.1117/12.974264
Show Author Affiliations
Xiao-chuan Gan, National Institute of Metrology (China)
Ming-zhao He, National Institute of Metrology (China)
Lian-fu Li, National Institute of Metrology (China)
Xiao-you Ye, National Institute of Metrology (China)
Jian-shuang Li, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top