Share Email Print

Proceedings Paper

Development of large area nanostructure antireflection coatings for EO/IR sensor applications
Author(s): Ashok K. Sood; Gopal Pethuraja; Adam W. Sood; Roger E. Welser; Yash R. Puri; Jaehee Cho; E. Fred Schubert; Nibir K. Dhar; Priyalal Wijewarnasuriya; Martin B. Soprano
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Electro-optical/infrared nanosensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings with both broadband and omnidirectional characteristics. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on large area substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing broadband reflection losses to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated on 3-inch diameter substrates.

Paper Details

Date Published: 15 October 2012
PDF: 9 pages
Proc. SPIE 8512, Infrared Sensors, Devices, and Applications II, 85120R (15 October 2012); doi: 10.1117/12.974239
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Gopal Pethuraja, Magnolia Optical Technologies, Inc. (United States)
Adam W. Sood, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Yash R. Puri, Magnolia Optical Technologies, Inc. (United States)
Jaehee Cho, Rensselaer Polytechnic Institute (United States)
E. Fred Schubert, Rensselaer Polytechnic Institute (United States)
Nibir K. Dhar, DARPA/MTO (United States)
Priyalal Wijewarnasuriya, U.S. Army Research Lab. (United States)
Martin B. Soprano, U.S. Army (United States)

Published in SPIE Proceedings Vol. 8512:
Infrared Sensors, Devices, and Applications II
Paul D. LeVan; Ashok K. Sood; Priyalal S. Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

© SPIE. Terms of Use
Back to Top