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Proceedings Paper

Judgement and analysis of optical film laser-induced damage
Author(s): Wei Shi; Li-hong Yang; Jun-hong Su; Jun-qi Xu; Feng Guo
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Paper Abstract

In order to assisting human vision to identify degree of injury of optical films after laser irradiation , magnified optical films images are acquired by a CCD camera together with a microscope before and after slotted by pulsed Laser in a real time in experiments. The algorithms to judge the film damage and identify the damage morphologies are designed and texted by MATLAB. The maximum damage diameter and damage area, which are calculated using minimum external rectangle and region filling separately, are compared with state standards on damage criterion of optical film to judge the damage degree. Morphologies characters of 3 typical laser damage mechanisms to optical films are explored. Geometric features and color features parameters of damage pictures were extracted, just like the circularity of the damage area’s edge and rgb average level in the damage areas and the undamaged, through which we could deduce the main damage mechanisms. The experiment shows that the algorithms could judge the film damage and identify the damage morphologies effectively. The algorithms could be improved and used in automatic measurement and test of LIDT of optical films, also in analysis of laser damage mechanism for consideration.

Paper Details

Date Published: 15 October 2012
PDF: 9 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170V (15 October 2012); doi: 10.1117/12.973980
Show Author Affiliations
Wei Shi, Xi'an Technological Univ. (China)
Li-hong Yang, Xi'an Technological Univ. (China)
Jun-hong Su, Xi'an Technological Univ. (China)
Jun-qi Xu, Xi'an Technological Univ. (China)
Feng Guo, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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