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Proceedings Paper

Research in the modulation transfer function (MTF) measurement of InGaAs focal plane arrays
Author(s): Zhonghua Xu; Jiaxiong Fang
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Paper Abstract

The Modulation Transfer Function (MTF) of an opto-electrical device is defined as the ratio of the system output modulation to the input modulation, which describes the performance of the imaging system in the Fourier domain. Accurate measurement of the MTF is often obtained by analyzing the high-quality image of a special target reproduced by the optical system with known MTF. To evaluate the MTF of short-wave infrared InGaAs focal plane arrays (FPAs), we develop a laboratory system with high precision and automation based on the slit scan method. An 8*1 linear InGaAs FPAs is then measured by this test set-up for the first time to evaluate the MTF of each pixel at room temperature. The results show a good MTF repeatability and uniformity of the 8*1 InGaAs FPAs. The relationship between the MTF and illumination is also discussed.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 841905 (15 October 2012); doi: 10.1117/12.973762
Show Author Affiliations
Zhonghua Xu, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Jiaxiong Fang, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Zhifeng Wang; Junsheng Yu, Editor(s)

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